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Semiconductor measurements and instrumentation.
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TextLanguage: English Publication details: 1975DDC classification: - D6544:4, L5.1-L5.6
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| Cover image | Item type | Current library | Home library | Collection | Shelving location | Call number | Materials specified | Vol info | URL | Copy number | Status | Notes | Date due | Barcode | Item holds | Item hold queue priority | Course reserves | |
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Textual
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South Campus Library | South Campus Library | D6544:4 L5.1-L5.6 (Browse shelf(Opens below)) | Available | SC0848454 |
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Semiconductor measurements and instrumentation.
APA
Runyan W R, . (1975). Semiconductor measurements and instrumentation. : .
Chicago
Runyan W R, . 1975. Semiconductor measurements and instrumentation. : .
Harvard
Runyan W R, . (1975). Semiconductor measurements and instrumentation. : .
MLA
Runyan W R, . Semiconductor measurements and instrumentation. : . 1975.
