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ISBD view for Testing Complex and Embedded Systems

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Testing Complex and Embedded Systems

Kim H. Pries; Jon M. Quigley

Testing Complex and Embedded Systems - Taylor and Francis 2011

ISBN: 9781315169453

Source: EBOOK

Testing Complex and Embedded Systems

APA

Kim H. Pries; Jon M. Quigley, .Testing Complex and Embedded Systems. : Taylor and Francis.

Chicago

Kim H. Pries; Jon M. Quigley, .Testing Complex and Embedded Systems. : Taylor and Francis.

Harvard

Kim H. Pries; Jon M. Quigley, .Testing Complex and Embedded Systems. : Taylor and Francis.

MLA

Kim H. Pries; Jon M. Quigley, .: Taylor and Francis. .

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