Normal view MARC view ISBD view

Point defects in semiconductors

Lannoo M

Point defects in semiconductors - Berlin Springer-Verlag 1981 - xvii,265p. cm. - Springer series in solid state science; 22 .

Standard No.: 48876

Source: Textual

Subjects--Topical Terms:
Semiconductors

Dewey Class. No.: C6:212, M11.1

Place hold
Place recall
Print
Cite
Add to your cart (remove)
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)