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Scanning electron microscopy: Physica of image formation and microanalysis

Reimer Ludwig

Scanning electron microscopy: Physica of image formation and microanalysis - Berlin Springer-Verlag 1985 - xv,457p. cm. - Springer series in optical sciences; 45 .

Standard No.: 27298

Source: Textual

Subjects--Topical Terms:
Scattering

Dewey Class. No.: C5:7:(G:1996), M5

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