Normal view MARC view ISBD view

Reliability and degradation

Howes M J Ed.

Reliability and degradation - Chichester John Wiley 1981 - xii, 444p. cm. - Wiley series in solid state devices and circuits .

Includes bibliography

Standard No.: 48877

Source: Textual

Subjects--Topical Terms:
Semiconductors

Dewey Class. No.: C6:212, M1

Place hold
Place recall
Print
Cite
Add to your cart (remove)
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)