Normal view MARC view ISBD view

Field ion microscopy

Bowkett K M

Field ion microscopy - Amsterdam North Holland 1970 - x,257p. cm. - Defects in crystelline solids; 2 .

Standard No.: 32579

Source: Textual

Subjects--Topical Terms:
Crystal structure

Dewey Class. No.: C216:80j5:3, L0

Place hold
Place recall
Print
Cite
Add to your cart (remove)
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)