Normal view MARC view ISBD view

Electron microscopy and analysis

Goodhew Peter J; Humphreys John; Beanland Richard

Electron microscopy and analysis - 3 - London Taylor & Francis 2001 - xii,251p. ill.

Include bibliographical references.; Index 243-251p.

ISBN: 9780748409688 (pbk) SL01560227

Standard No.: 188745

Source: 3188, 23/04/2013, Educational Book Agency (India) Textbook

Subjects--Topical Terms:
Electron diffraction
Electron microscopy
Chemistry

Dewey Class. No.: E:(G:1996), P1-;4 TE

Place hold
Print
Cite
Add to your cart (remove)
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)