Basic concepts of X-ray diffraction (Record no. 16653)

MARC details
000 -LEADER
fixed length control field 02143nam a2200265Ia 4500
003 - CONTROL NUMBER IDENTIFIER
control field OSt
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20250715110056.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 220909b |||||||| |||| 00| 0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9783527335619
037 ## - SOURCE OF ACQUISITION
Terms of availability Textbook
040 ## - CATALOGING SOURCE
Original cataloging agency CSL
Language of cataloging eng
Transcribing agency CSL
041 ## - LANGUAGE CODE
Language code of text/sound track or separate title eng
084 ## - COLON CLASSIFICATION NUMBER
Classification number C53:55 Q4 TE
Assigning agency CSL
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Zolotoyabko, Emil
Relator term author.
9 (RLIN) 715255
245 #0 - TITLE STATEMENT
Title Basic concepts of X-ray diffraction
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. Weinheim :
Name of publisher, distributor, etc. Wiley,
Date of publication, distribution, etc. 2014.
300 ## - PHYSICAL DESCRIPTION
Extent xii, 297p.
Other physical details : ill.
500 ## - GENERAL NOTE
General note References 285-290p.; Index 291-297p.
520 ## - SUMMARY, ETC.
Summary, etc. Authored by a university professor deeply involved in X-ray diffraction-related research, this textbook is based on his lectures given to graduate students for more than 20 years. It adopts a well-balanced approach, describing basic concepts and experimental techniques, which make X-ray diffraction an unsurpassed method for studying the structure of materials.<br/>Both dynamical and kinematic X-ray diffraction is considered from a unified viewpoint, in which the dynamical diffraction in single-scattering approximation serves as a bridge between these two parts. The text emphasizes the fundamental laws that govern the interaction of X-rays with matter, but also covers in detail classical and modern applications, e.g., line broadening, texture and strain/stress analyses, X-ray mapping in reciprocal space, high-resolution X-ray diffraction in the spatial and wave vector domains, X-ray focusing, inelastic and time-resolved X-ray scattering. This unique scope, in combination with otherwise hard-to-find information on analytic expressions for simulating X-ray diffraction profiles in thin-film heterostructures, X-ray interaction with phonons, coherent scattering of Mossbauer radiation, and energy-variable X-ray diffraction, makes the book indispensable for any serious user of X-ray diffraction techniques.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Acoustic waves
9 (RLIN) 815624
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Inelastic scattering
9 (RLIN) 815625
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Darwin approach
9 (RLIN) 815626
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Classification part C53:55 Q4 TE
Koha item type Textbook
Source of classification or shelving scheme Colon Classification (CC)
Suppress in OPAC No
Holdings
Withdrawn status Lost status Damaged status Not for loan Home library Current library Date acquired Source of acquisition Total Checkouts Full call number Barcode Date last seen Price effective from Koha item type
        Central Science Library Central Science Library 2022-09-12 792, 10/03/2015, Dhanraj Book House   C53:55 Q4 TE SL1598021 2022-09-12 2022-09-12 Textbook
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