APA
Chadi El Chemali; Arnon M. Hurwitz; Argon Chen; Ruey-Shan Guo; William Moyne; Nital Patel; Taber H. Smith; Duane Boning; Jin-Jung Chen; Robert A. Soper; Jinn-Yi Yeh; Jonathan Chapple-Sokol; Naumann Chaudhry; John Colt; Rock Nadeau; Tarun Parikh; Elke Rundensteiner; Paul H. Smith; Joe White; Victor Solakhian; James Moyne; Enrique del Castillo; B. Karumullah Khan, .Run-to-Run Control in Semiconductor Manufacturing. : Taylor and Francis.
Chicago
Chadi El Chemali; Arnon M. Hurwitz; Argon Chen; Ruey-Shan Guo; William Moyne; Nital Patel; Taber H. Smith; Duane Boning; Jin-Jung Chen; Robert A. Soper; Jinn-Yi Yeh; Jonathan Chapple-Sokol; Naumann Chaudhry; John Colt; Rock Nadeau; Tarun Parikh; Elke Rundensteiner; Paul H. Smith; Joe White; Victor Solakhian; James Moyne; Enrique del Castillo; B. Karumullah Khan, .Run-to-Run Control in Semiconductor Manufacturing. : Taylor and Francis.
Harvard
Chadi El Chemali; Arnon M. Hurwitz; Argon Chen; Ruey-Shan Guo; William Moyne; Nital Patel; Taber H. Smith; Duane Boning; Jin-Jung Chen; Robert A. Soper; Jinn-Yi Yeh; Jonathan Chapple-Sokol; Naumann Chaudhry; John Colt; Rock Nadeau; Tarun Parikh; Elke Rundensteiner; Paul H. Smith; Joe White; Victor Solakhian; James Moyne; Enrique del Castillo; B. Karumullah Khan, .Run-to-Run Control in Semiconductor Manufacturing. : Taylor and Francis.
MLA
Chadi El Chemali; Arnon M. Hurwitz; Argon Chen; Ruey-Shan Guo; William Moyne; Nital Patel; Taber H. Smith; Duane Boning; Jin-Jung Chen; Robert A. Soper; Jinn-Yi Yeh; Jonathan Chapple-Sokol; Naumann Chaudhry; John Colt; Rock Nadeau; Tarun Parikh; Elke Rundensteiner; Paul H. Smith; Joe White; Victor Solakhian; James Moyne; Enrique del Castillo; B. Karumullah Khan, .: Taylor and Francis. .