APA
Pratap Yogesh Au, University of Delhi. Faculty of Inter-Displinary & Applied Sciences. Department of Electronic Science, Gupta Mridula Gu, Gupta R. S. Gu & University of Delhi. Faculty of Inter-Displinary & Applied Sciences. Department of Electronic Science. (2015). Modeling, simulation and characterization of gate-all-around junctionless transistor-reliability and digital applications. : .
Chicago
Pratap Yogesh Au, University of Delhi. Faculty of Inter-Displinary & Applied Sciences. Department of Electronic Science, Gupta Mridula Gu, Gupta R. S. Gu and University of Delhi. Faculty of Inter-Displinary & Applied Sciences. Department of Electronic Science. 2015. Modeling, simulation and characterization of gate-all-around junctionless transistor-reliability and digital applications. : .
Harvard
Pratap Yogesh Au, University of Delhi. Faculty of Inter-Displinary & Applied Sciences. Department of Electronic Science, Gupta Mridula Gu, Gupta R. S. Gu and University of Delhi. Faculty of Inter-Displinary & Applied Sciences. Department of Electronic Science. (2015). Modeling, simulation and characterization of gate-all-around junctionless transistor-reliability and digital applications. : .
MLA
Pratap Yogesh Au, University of Delhi. Faculty of Inter-Displinary & Applied Sciences. Department of Electronic Science, Gupta Mridula Gu, Gupta R. S. Gu and University of Delhi. Faculty of Inter-Displinary & Applied Sciences. Department of Electronic Science. Modeling, simulation and characterization of gate-all-around junctionless transistor-reliability and digital applications. : . 2015.