Normal view MARC view

Entry Personal Name

Number of records used in: 1

001 - CONTROL NUMBER

  • control field: 1185262

003 - CONTROL NUMBER IDENTIFIER

  • control field: OSt

005 - DATE AND TIME OF LATEST TRANSACTION

  • control field: 20260324131353.0

008 - FIXED-LENGTH DATA ELEMENTS

  • fixed length control field: 260324|| aca||aabn | a|a d

040 ## - CATALOGING SOURCE

  • Original cataloging agency: OSt
  • Transcribing agency: OSt

100 ## - HEADING--PERSONAL NAME

  • Personal name: Prabhat Mishra; Enrico Macii; Kenneth L. McMillan; Alain Clouard; John Sanguinetti; Franz E. Marschner; Marco Di Natale; Ralph H. Otten; Grant Martin; Ahmed Jerraya; Robert F. Damiano; Stephen A. Edwards; Kwang-Ting(Tim) Cheng; Marcello Coppola; Limor Fix; Steven Howard Leibson; Bozena Kaminska; Bernd Koenemann; Gaurav Singh; John Wilson; Miltos D. Grammatikakis; Wayne Wolf; Sumit Gupta; Sandeep Shukla; Vivek Tiwari; Renu Mehra; Massimo Poncino; Shuvra S. Bhattacharyya; Mike Bershteyn; Raul Camposano; Iuliana Bacivarov; Nikil Dutt; Li-Chung Wang; Harry D. Foster; Jean-Philippe Strassen; Frank Ghenassia; Laurent Maillet-Contoz; Joseph Tobin Buck; Naehyuck Chang; Louis Scheffer; Luciano Lavagno; Ray Turner; Rajesh Gupta

670 ## - SOURCE DATA FOUND

  • Source citation: Work cat.: (OSt)1782336: Prabhat Mishra; Enrico Macii; Kenneth L. McMillan; Alain Clouard; John Sanguinetti; Franz E. Marschner; Marco Di Natale; Ralph H. Otten; Grant Martin; Ahmed Jerraya; Robert F. Damiano; Stephen A. Edwards; Kwang-Ting(Tim) Cheng; Marcello Coppola; Limor Fix; Steven Howard Leibson; Bozena Kaminska; Bernd Koenemann; Gaurav Singh; John Wilson; Miltos D. Grammatikakis; Wayne Wolf; Sumit Gupta; Sandeep Shukla; Vivek Tiwari; Renu Mehra; Massimo Poncino; Shuvra S. Bhattacharyya; Mike Bershteyn; Raul Camposano; Iuliana Bacivarov; Nikil Dutt; Li-Chung Wang; Harry D. Foster; Jean-Philippe Strassen; Frank Ghenassia; Laurent Maillet-Contoz; Joseph Tobin Buck; Naehyuck Chang; Louis Scheffer; Luciano Lavagno; Ray Turner; Rajesh Gupta, EDA for IC System Design, Verification, and Testing
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