Normal view MARC view

Entry Personal Name

Number of records used in: 1

001 - CONTROL NUMBER

  • control field: 1198168

003 - CONTROL NUMBER IDENTIFIER

  • control field: OSt

005 - DATE AND TIME OF LATEST TRANSACTION

  • control field: 20260324134805.0

008 - FIXED-LENGTH DATA ELEMENTS

  • fixed length control field: 260324|| aca||aabn | a|a d

040 ## - CATALOGING SOURCE

  • Original cataloging agency: OSt
  • Transcribing agency: OSt

100 ## - HEADING--PERSONAL NAME

  • Personal name: Chadi El Chemali; Arnon M. Hurwitz; Argon Chen; Ruey-Shan Guo; William Moyne; Nital Patel; Taber H. Smith; Duane Boning; Jin-Jung Chen; Robert A. Soper; Jinn-Yi Yeh; Jonathan Chapple-Sokol; Naumann Chaudhry; John Colt; Rock Nadeau; Tarun Parikh; Elke Rundensteiner; Paul H. Smith; Joe White; Victor Solakhian; James Moyne; Enrique del Castillo; B. Karumullah Khan

670 ## - SOURCE DATA FOUND

  • Source citation: Work cat.: (OSt)1798597: Chadi El Chemali; Arnon M. Hurwitz; Argon Chen; Ruey-Shan Guo; William Moyne; Nital Patel; Taber H. Smith; Duane Boning; Jin-Jung Chen; Robert A. Soper; Jinn-Yi Yeh; Jonathan Chapple-Sokol; Naumann Chaudhry; John Colt; Rock Nadeau; Tarun Parikh; Elke Rundensteiner; Paul H. Smith; Joe White; Victor Solakhian; James Moyne; Enrique del Castillo; B. Karumullah Khan, Run-to-Run Control in Semiconductor Manufacturing
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