Electron nano-imaging: Basics of imaging and diffraction for TEM and STEM

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TextLanguage: English Publication details: Japan Springer 2017Description: xxviii, 333p. ill. cmISBN:

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Cover image	Item type	Current library	Home library	Collection	Shelving location	Call number	Materials specified	Vol info	URL	Copy number	Status	Notes	Date due	Barcode	Item holds	Item hold queue priority	Course reserves
	Textual	Central Science Library	Central Science Library			E:(G:1996) Q7 (Browse shelf(Opens below))					Available			SL1601926

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Appendix 219-312p.; Author index 313-315p.; Subject index 317-333p.

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