Scanning electron microscopy and X-ray microanalysis

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TextLanguage: English Publication details: New York Kluwer Academic/Plenum Publishers 2003Edition: 3Description: xix, 689p. cm. Includes with CD-ROMISBN:

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Textbook

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Cover image	Item type	Current library	Home library	Collection	Shelving location	Call number	Materials specified	Vol info	URL	Copy number	Status	Notes	Date due	Barcode	Item holds	Item hold queue priority	Course reserves
	Textbook	Central Science Library	Central Science Library			G:1996 P3 TH (Browse shelf(Opens below))					Available			SL1288764

Includes bibliographical references; Index 675-689p

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