High resolution x-ray diffraction study of as grown and BF /Sub 2/ implanted silicon single crystals
By: Contributor(s): Material type:
TextLanguage: English Publication details: Delhi University of Delhi India 1994Subject(s):
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High resolution x-ray diffraction study of as grown and BF /Sub 2/ implanted silicon single crystals
APA
Bhagavannarayana Godavarthi, University of Delhi. Faculty of Science. Department of Physics and Astrophysics, Krishan Lal Gu, Trigunayat G C Gu & University of Delhi. Faculty of Science. Department of Physics and Astrophysics. (1994). High resolution x-ray diffraction study of as grown and BF /Sub 2/ implanted silicon single crystals. Delhi: University of Delhi India.
Chicago
Bhagavannarayana Godavarthi, University of Delhi. Faculty of Science. Department of Physics and Astrophysics, Krishan Lal Gu, Trigunayat G C Gu and University of Delhi. Faculty of Science. Department of Physics and Astrophysics. 1994. High resolution x-ray diffraction study of as grown and BF /Sub 2/ implanted silicon single crystals. Delhi: University of Delhi India.
Harvard
Bhagavannarayana Godavarthi, University of Delhi. Faculty of Science. Department of Physics and Astrophysics, Krishan Lal Gu, Trigunayat G C Gu and University of Delhi. Faculty of Science. Department of Physics and Astrophysics. (1994). High resolution x-ray diffraction study of as grown and BF /Sub 2/ implanted silicon single crystals. Delhi: University of Delhi India.
MLA
Bhagavannarayana Godavarthi, University of Delhi. Faculty of Science. Department of Physics and Astrophysics, Krishan Lal Gu, Trigunayat G C Gu and University of Delhi. Faculty of Science. Department of Physics and Astrophysics. High resolution x-ray diffraction study of as grown and BF /Sub 2/ implanted silicon single crystals. Delhi: University of Delhi India. 1994.
