Egerton Ray F <br/><br/>
Physical principles of electron microscopy:an introduction to TEM,SEM, and AEM 

 - New  York Springer           2007 
 - ix, 202p.  cm. 
<br/><br/> Appendix 191-194p.; References 195-196p.; Index 197-202p. 
<br/><br/><label>ISBN: </label>9780387258000 (hbd) 
<br/><br/><label>Standard No.: </label>82542 
<br/><br/><label>Source: </label> 009, 28/11/2008, Aviva Books Company  Textbook 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Physics
<br/><br/><label>Dewey Class. No.: </label>G:19, P7   Carpa