He Bob B <br/><br/>
Two-dimensional x-ray diffraction 

 - 2 
 - Hoboken  John Wiley           2018 
 - xv, 472p. ill.  cm. 
<br/><br/> Appendix A-B 453-464p.; Index 465-472p. 
<br/><br/><label>ISBN: </label>9781119356103 (hbk) 
<br/><br/><label>Standard No.: </label>199647 
<br/><br/><label>Source: </label> 356, 14/03/2019, Sai Global Indian Books  Textual 
<br/><br/><label>Subjects--Topical Terms: </label><br/> Combinatorial screening<br/> Stress measurment<br/> Texture analysis<br/> X-ray detectors<br/>Physics
<br/><br/><label>Dewey Class. No.: </label>C53:55, Q8 Carpa