Goodhew Peter J <br/><br/>
Electron microscopy and analysis   Humphreys John  Beanland Richard    

 - 3 
 - London  Taylor & Francis          2001 
 - xii,251p. ill.  cm. 
<br/><br/> Include bibliographical references.; Index 243-251p. 
<br/><br/><label>ISBN: </label>9780748409688 (pbk) 
<br/><br/><label>Standard No.: </label>188731 
<br/><br/><label>Source: </label> 3183, 23/04/2013, Educational Book Agency (India)  Textual 
<br/><br/><label>Subjects--Topical Terms: </label><br/> Electron diffraction<br/> Electron microscopy<br/>Chemistry
<br/><br/><label>Dewey Class. No.: </label>E:(G:1996), P1-;4 Carc