Meyer, Ernst <br/><br/>
Scanning probe microscopy: The lab ob a tip 
Meyer, Ernst; Bennewitz, Roland; Hug, Hans J 
 - 2nd 
 - Switzerland  Springer  2021 
 - xiv, 322p. ill. 
<br/><br/><label>ISBN: </label>9783030370916 
<br/><br/><label>Source: </label>Textual 
<br/><br/><label>Subjects--Topical Terms: </label><br/> Artifacts in SPM<br/> Force microscopy<br/> Magnetic force microscopy<br/>Physics