Mcpherson J W <br/><br/>
Reliability physics and engineering 

 - 2 
 - New York         Springer        2013 
 - xvi, 399p. ill. 
<br/><br/> Bibliography 376-376p.; Appendices 377-390p.; Index 391-399p. 
<br/><br/><label>ISBN: </label>9783319001210 (hbk) SL01562768 
<br/><br/><label>Standard No.: </label>192638 
<br/><br/><label>Source: </label> 2780, 06/02/2015, Ashutosh Technical Books  Textbook 
<br/><br/><label>Subjects--Topical Terms: </label><br/> Accelerated degradation<br/> Screening<br/>Gaussian statistics
<br/><br/><label>Dewey Class. No.: </label>B2T0bD:4, Q0;Q3 TC