Ueda Osamu Ed. <br/><br/>
Materials and reliability handbook for semiconductor optical and electron devices 

 - Dordrecht  Springer         2013 
 - xv,616p. col.ill.  cm 
<br/><br/> Index 611-616p. 
<br/><br/><label>ISBN: </label>9781461443360 (hbk) 
<br/><br/><label>Standard No.: </label>197571 
<br/><br/><label>Source: </label> 50, 07/03/2017, Aviva Books Company  Textual 
<br/><br/><label>Subjects--Topical Terms: </label><br/> InGaN laser diode degradation<br/> Reliability simulation<br/> Reliability testing<br/>Physics
<br/><br/><label>Dewey Class. No.: </label>C6:212g, Q3