TY  - BOOK
AU  - Ueda Osamu Ed.
AU  -  Pearton Stephen J. Ed.
TI  - Materials and reliability handbook for semiconductor optical and electron devices
SN  - 9781461443360 (hbk)
U1  - C6:212g, Q3 
PY  - 2013///
CY  - Dordrecht
PB  - Springer       
KW  -  InGaN laser diode degradation
KW  -  Reliability simulation
KW  -  Reliability testing
KW  - Physics
N1  - Index 611-616p
ER  -