TY  - BOOK
AU  - Dumin D J
TI  - Oxide Reliability: a Summary of Silicon Oxide Wearout, Breakdown, and Reliability
SN  - 9789812778062
PB  - World Scientific
KW  - Materials Science
UR  - https://www.worldscientific.com/worldscibooks/10.1142/4880#t=toc
ER  -