TY  - BOOK
AU  - Pierre-Richard Dahoo
TI  - Applications and Metrology at Nanometer-Scale 1 - Smart Materials, Electromagnetic Waves and Uncertainties
SN  - 9781119808244
PB  - Wiley
UR  - https://onlinelibrary.wiley.com/doi/book/10.1002/9781119808244
ER  -