TY  - BOOK
AU  - Pierre-Richard Dahoo
TI  - Applications and Metrology at Nanometer-Scale 2 - Measurement Systems, Quantum Engineering and RBDO Method
SN  - 9781119818984
PB  - Wiley
UR  - https://onlinelibrary.wiley.com/doi/book/10.1002/9781119818984
ER  -