TY  - BOOK
AU  - Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky
TI  - Dielectric Breakdown in Gigascale Electronics
SN  - 9783319432205
PB  - Springer
UR  - https://link.springer.com/openurl?genre=book&isbn=978-3-319-43220-5
ER  -