Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy <br/><br/>
Scanning Electron Microscopy and X-Ray Microanalysis 

 -  Springer  Springer  2018 
<br/><br/><label>ISBN: </label>9781493966769 
<br/><br/><label>Source: </label>EBOOK