TY  - BOOK
AU  - Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy
TI  - Scanning Electron Microscopy and X-Ray Microanalysis
SN  - 9781493966769
PB  - Springer
UR  - https://link.springer.com/openurl?genre=book&isbn=978-1-4939-6676-9
ER  -