TY  - BOOK
AU  - Sandeep K. Goel; Krishnendu Chakrabarty
TI  - Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
SN  - 9781315217819
PB  - Taylor and Francis
UR  - http://www.taylorfrancis.com/books/9781315217819
ER  -