TY  - BOOK
AU  - Ron Kielmeyer; Patrick Fay; Anthony Parker; Christopher Jones; John C. Cowles; J-P Lanteri; James Grantley Rathmell; Paul D. Hale; Kate A. Remley; Aaron Radomski; Todd Heckleman; Douglas A. Teeter; Edward T. Spears; Joseph M. Gering; Troels Nielsen; John Wendler, P; H. Mike Harris; Jakub Kucera; Peter Blakey; Urs Lott; John F. Sevic; Daniel G. Swanson; Mike Golio; Janet Golio; Robert Trew; Michael Steer; Lawrence P. Dunleavy; Charles Nelson; Robert Newgard; Jonathan B. Scott; John R. Mahon; M. Tentzeris; Brent Irvine; Ronald E. Ham; Walter R. Curtice; J. Stevenson Kenney; Alfy Riddle
TI  - RF and Microwave Circuits, Measurements, and Modeling
SN  - 9781315221878
PB  - Taylor and Francis
UR  - http://www.taylorfrancis.com/books/9781315221878
ER  -