J. Doneker <br/><br/>
Defect Recognition and Image Processing in Semiconductors 1997  Proceedings of the seventh conference on Defect Recognition and Image Processing, Berlin, September 1997 

 -  Taylor and Francis  1998 
<br/><br/><label>ISBN: </label>9781315140810 
<br/><br/><label>Source: </label>EBOOK