Michael G. Pecht; Edward B. Hakim; Pradeep Lall <br/><br/>
Influence of Temperature on Microelectronics and System Reliability  A Physics of Failure Approach 

 -  Taylor and Francis  1997 
<br/><br/><label>ISBN: </label>9780138750879 
<br/><br/><label>Source: </label>EBOOK