Tanaka Nobuo <br/><br/>
Electron nano-imaging: Basics of imaging and diffraction for TEM and STEM 

 - Japan  Springer         2017 
 - xxviii, 333p. ill.  cm 
<br/><br/> Appendix 219-312p.; Author index 313-315p.; Subject index 317-333p. 
<br/><br/><label>ISBN: </label>9784431565000 (hbk) 
<br/><br/><label>Standard No.: </label>197991 
<br/><br/><label>Source: </label> 2571, 06/09/2017, The Book Seller  Textual 
<br/><br/><label>Subjects--Topical Terms: </label><br/> Lattice images and structure images<br/> Transmission electro mircoscope<br/>Chemistry
<br/><br/><label>Dewey Class. No.: </label>E:(G:1996), Q7