Zalevsky, Zeev <br/><br/>
New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices 

 -  Elsevier  2013 
<br/><br/><label>ISBN: </label>9780323241434 
<br/><br/><label>Source: </label>EBOOK 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Engineering