TY  - BOOK
AU  - Zalevsky, Zeev
TI  - New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices
SN  - 9780323241434
PB  - Elsevier
KW  - Engineering
UR  - https://www.sciencedirect.com/science/book/9780323241434
ER  -