Siegel Benjamin M Ed. <br/><br/>
Physical aspects of electron microscopy and micro beam analysis 

 - New York   John wiley       1975 
 - xiii,474p.  cm. 
<br/><br/><label>Standard No.: </label>71272 
<br/><br/><label>Source: </label> Textual 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electron microscopy
<br/><br/><label>Dewey Class. No.: </label>G:1996, L5