Seebauer Edmund G Ed. <br/><br/>
Charged semiconductor defects: Structure, thermodynamics and diffusion 

 - London  Springer         2009 
 - xiv, 294p.  cm. 
 - Engineering materials and  processes .
<br/><br/> Includes bibliographical references.; Index 291-293p. 
<br/><br/><label>ISBN: </label>9781848820586 (hbd) 
<br/><br/><label>Standard No.: </label>84477 
<br/><br/><label>Source: </label> 2004, 11/08/2009, New India Book Agency  Textbook 
<br/><br/><label>Dewey Class. No.: </label>C6:212, P9   TB