TY  - BOOK
AU  - Seebauer Edmund G Ed.
AU  -  Kratzer Meredith C Ed.
TI  - Charged semiconductor defects: Structure, thermodynamics and diffusion
T2  - Engineering materials and  processes
SN  - 9781848820586 (hbd)
U1  - C6:212, P9   TB 
PY  - 2009///
CY  - London
PB  - Springer       
N1  - Includes bibliographical references.; Index 291-293p
ER  -