TY  - BOOK
AU  - Alford Terry L
AU  -  Feldman Leonard C
AU  -  Mayer James W
TI  - Fundamentals of nanoscale film analysis
SN  - 9780387292601 (hbd)
U1  - C21:(D), P7 
PY  - 2007///
CY  - New York 
PB  - Springer      
KW  -  Nanostructured material
KW  -  Thin film
KW  - Physics
N1  - Includes bibliographical references; Appendix 1-13 291-329p; Index 330-336p
ER  -