Pecharsky Vitalij K <br/><br/>
Fundamentals of powder diffraction and structural characterization of materials 

 - New York   Springer Science       2005 
 - xxiii, 713p. Includes CD-Rom  cm. 
<br/><br/> Index 704-713p. 
<br/><br/><label>ISBN: </label>e038724567 (CDRom) 0-387-24147-7 (pbk) 
<br/><br/><label>Standard No.: </label>78689 
<br/><br/><label>Source: </label> 1927, 05/10/2007, The Book Seller  Textual 
<br/><br/><label>Subjects--Topical Terms: </label><br/> X-ray Crystallography<br/> X-ray diffraction<br/>Chemistry
<br/><br/><label>Dewey Class. No.: </label>E:221, P5