Fewster Paul F <br/><br/>
X-Ray scattering form semiconductors and other materials 

 - 3 
 - New Jersey   World Scientific       2015 
 - xvi,493p. ill.  cm 
<br/><br/> Appendix 479-487p.; Index 489-493p. 
<br/><br/><label>ISBN: </label>9789814436922 (HBK) 
<br/><br/><label>Standard No.: </label>200649 
<br/><br/><label>Source: </label> 5329, 07/02/2019, Ashutosh Technical Books  Textual 
<br/><br/><label>Subjects--Topical Terms: </label><br/> Estimation of strutural parameters and interpretation<br/> Measuring scattering patterns<br/> Theory of X-ray scattering<br/>Physics
<br/><br/><label>Dewey Class. No.: </label>C53:58, Q5