TY  - BOOK
AU  - Fewster Paul F
TI  - X-Ray scattering form semiconductors and other materials
SN  - 9789814436922 (HBK)
U1  - C53:58, Q5 
PY  - 2015///
CY  - New Jersey 
PB  - World Scientific     
KW  -  Estimation of strutural parameters and interpretation
KW  -  Measuring scattering patterns
KW  -  Theory of X-ray scattering
KW  - Physics
N1  - Appendix 479-487p.; Index 489-493p
ER  -