TY  - BOOK
AU  - Lannoo M
AU  -  Bourgoin J
TI  - Point defects in semiconductors
T2  - Springer series in solid state science; 22
U1  - C6:212, M11.1 
PY  - 1981///
CY  - Berlin
PB  - Springer-Verlag         
KW  - Semiconductors
ER  -