Reimer Ludwig <br/><br/>
Scanning electron microscopy: Physica of image formation and microanalysis 

 - Berlin  Springer-Verlag           1985 
 - xv,457p.  cm. 
 - Springer series in optical sciences; 45 .
<br/><br/><label>Standard No.: </label>27298 
<br/><br/><label>Source: </label> Textual 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Scattering
<br/><br/><label>Dewey Class. No.: </label>C5:7:(G:1996), M5