Goldstein Joseph I. <br/><br/>
Scanning electron microscopy and X-ray microanalysis 

 - 3 
 - New York       Kluwer Academic/Plenum Publishers        2003 
 - xix, 689p.  cm. Includes with CD-ROM 
<br/><br/> Includes bibliographical references; Index 675-689p 
<br/><br/><label>ISBN: </label>0306472929 (hbd) 
<br/><br/><label>Standard No.: </label>2191 
<br/><br/><label>Source: </label> Textbook 
<br/><br/><label>Dewey Class. No.: </label>G:1996, P3      TH