Sanders Wesley C <br/><br/>
Atomic force microscopy: Fundamental concepts and laboratory investigations 

 - Boca Raton   CRC Press       2020 
 - xiii, 139p. ill.  cm 
<br/><br/> Index 137-139p. 
<br/><br/><label>ISBN: </label>9780367218645 (pbk) 
<br/><br/><label>Standard No.: </label>201568 
<br/><br/><label>Source: </label> 1865, 14/02/2020, New India Book Agency  Textual 
<br/><br/><label>Subjects--Topical Terms: </label><br/> AFM electronics<br/> Image processing<br/> Lateral force microscopy<br/>Physics
<br/><br/><label>Dewey Class. No.: </label>C9B3, R0