Howes M J Ed. <br/><br/>
Reliability and degradation 

 - Chichester  John Wiley          1981 
 - xii, 444p.  cm. 
 - Wiley series in solid state devices and circuits .
<br/><br/> Includes bibliography 
<br/><br/><label>Standard No.: </label>48877 
<br/><br/><label>Source: </label> Textual 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors
<br/><br/><label>Dewey Class. No.: </label>C6:212, M1