TY  - BOOK
AU  - Howes M J Ed.
AU  -  Morgan D V Ed.
TI  - Reliability and degradation
T2  - Wiley series in solid state devices and circuits
U1  - C6:212, M1 
PY  - 1981///
CY  - Chichester
PB  - John Wiley        
KW  - Semiconductors
N1  - Includes bibliography
ER  -