Bowkett K M <br/><br/>
Field ion microscopy 

 - Amsterdam  North Holland          1970 
 - x,257p.  cm. 
 - Defects in crystelline solids; 2 .
<br/><br/><label>Standard No.: </label>32579 
<br/><br/><label>Source: </label> Textual 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Crystal structure
<br/><br/><label>Dewey Class. No.: </label>C216:80j5:3, L0