Miller D M Ed. <br/><br/>
Developments in integrated circuit testing 

 - London  Academic Press          1987 
 - 440p.  cm. 
 - Perspective in computing; 18 .
<br/><br/><label>Standard No.: </label>33175 
<br/><br/><label>Source: </label> Textual 
<br/><br/><label>Subjects--Topical Terms: </label><br/> Circuits<br/> Electronics<br/>Engineering
<br/><br/><label>Dewey Class. No.: </label>D65,2, M7